共 35 条
- [12] Force measurement in a nanomachining instrument [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (11) : 4325 - 4329
- [13] Construction and testing of a nanomachining instrument [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2000, 24 (04): : 320 - 328
- [14] Precision nano-fabrication and evaluation of a large area sinusoidal grid surface for a surface encoder [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2003, 27 (03): : 289 - 298
- [15] Surface profile measurement of a sinusoidal grid using an atomic force microscope on a diamond turning machine [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2007, 31 (03): : 304 - 309
- [16] Nanometer edge profile measurement of diamond cutting tools by atomic force microscope with optical alignment sensor [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2006, 30 (04): : 396 - 405
- [17] Dimensional micro and nano metrology [J]. CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2006, 55 (02) : 721 - 743
- [19] Improving machining performance of single-crystal diamond tools irradiated by a focused ion beam [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2014, 38 (01): : 174 - 182
- [20] Lee K. W., 2011, International Journal of Precision Technology, V2, P211, DOI 10.1504/IJPTECH.2011.039460