A high-resolution time-of-flight energy analyzer for femtosecond electron pulses at 30 keV

被引：9
|
作者：
Gliserin, Alexander [1 ]
Walbran, Matthew
Baum, Peter [1 ]
机构：
[1] Univ Munich, Coulombwall 1, D-85748 Garching, Germany
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 03期
基金：
欧洲研究理事会;
关键词：
CHARGE-DENSITY; PHASE; DIFFRACTION; DYNAMICS; MOTIONS;
D O I：
10.1063/1.4942912
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We report a time-of-flight spectrometer for electron pulses at up to 30 keV, which is a suitable energy for atomic-resolution femtosecond investigations via time-resolved electron diffraction, microscopy, and energy loss spectroscopy. For realistic femtosecond beams without apertures, the instrument's energy resolution is similar to 0.5 eV (full width at half maximum) or 2 x 10(-5) at a throughput of 50%-90%. We demonstrate the analyzer's versatility by three first applications, namely, femtosecond electron pulse metrology via optical streaking, in situ drift correction in laser-microwave synchronization for electron pulse compression, and time-resolved electron energy loss spectroscopy of aluminum, showing the instrument's capability of tracking plasmonic loss peak positions with few-meV accuracy. (C) 2016 AIP Publishing LLC.
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收藏
页数：10
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