A high-resolution time-of-flight energy analyzer for femtosecond electron pulses at 30 keV

被引：9

作者：

Gliserin, Alexander ^{[1
]}

Walbran, Matthew

Baum, Peter ^{[1
]}

机构：

[1] Univ Munich, Coulombwall 1, D-85748 Garching, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 03期

基金：

欧洲研究理事会;

关键词：

CHARGE-DENSITY; PHASE; DIFFRACTION; DYNAMICS; MOTIONS;

D O I：

10.1063/1.4942912

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report a time-of-flight spectrometer for electron pulses at up to 30 keV, which is a suitable energy for atomic-resolution femtosecond investigations via time-resolved electron diffraction, microscopy, and energy loss spectroscopy. For realistic femtosecond beams without apertures, the instrument's energy resolution is similar to 0.5 eV (full width at half maximum) or 2 x 10(-5) at a throughput of 50%-90%. We demonstrate the analyzer's versatility by three first applications, namely, femtosecond electron pulse metrology via optical streaking, in situ drift correction in laser-microwave synchronization for electron pulse compression, and time-resolved electron energy loss spectroscopy of aluminum, showing the instrument's capability of tracking plasmonic loss peak positions with few-meV accuracy. (C) 2016 AIP Publishing LLC.

引用

页数：10

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