Simulation of thermal-neutron-induced single-event upset using particle and heavy-ion transport code system

被引：0
|
作者：
Arita, Yutaka
Niita, Koji
Kihara, Yuji
Mitsuhasi, Junich
Takai, Mikio
Ogawa, Izumi
Kishimoto, Tadafumi
Yoshihara, Tsutomu
机构：
[1] Renesas Technol Corp, Itami, Hyogo 6640005, Japan
[2] Res Org Informat Sci & Technol, Ibaraki 3191106, Japan
[3] Osaka Univ, Ctr Quantum Sci & Technol Under Extreme Condit, Osaka 5608531, Japan
[4] Osaka Univ, Grad Sch Engn Sci, Osaka 5608531, Japan
[5] Osaka Univ, Dept Phys, Osaka 5608531, Japan
[6] Waseda Univ, Grad Sch Informat Prod & Syst, Kitakyushu, Fukuoka 8080135, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2007年 / 46卷 / 6A期
关键词：
PHITS; single-event upset; thermal neutron; simulation; SRAM;
D O I：
10.1143/JJAP.46.3377
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The simulation of a thermal-neutron-induced single-event upset (SEU) was performed on a 0.4-mu m-design-rule 4 Mbit static 14 random access memory (SRAM) using particle and heavy-ion transport code system (PHITS). The SEU rates obtained by the simulation were in very good agreement with the result of experiments. PHITS is a useful tool for simulating SEUs in semiconductor devices. To further improve the accuracy of the simulation, additional methods for tallying the energy deposition are required for PHITS.
引用
收藏
页码：3377 / 3379
页数：3
相关论文
共 47 条
  • [21] Overview of particle and heavy ion transport code system PHITS
    Sato, Tatsuhiko
    Niita, Koji
    Matsuda, Norihiro
    Hashimoto, Shintaro
    Iwamoto, Yosuke
    Furuta, Takuya
    Noda, Shusaku
    Ogawa, Tatsuhiko
    Iwase, Hiroshi
    Nakashima, Hiroshi
    Fukahori, Tokio
    Okumura, Keisuke
    Kai, Tetsuya
    Chiba, Satoshi
    Sihver, Lembit
    ANNALS OF NUCLEAR ENERGY, 2015, 82 : 110 - 115
  • [22] Assessing single event upset susceptibility of InAlN HEMT with cap layer under heavy-ion environment
    Kumari, Vandana
    Gupta, Mridula
    Saxena, Manoj
    MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, 2024,
  • [23] Improvements in the particle and heavy-ion transport code system (PHITS) for simulating neutron-response functions and detection efficiencies of a liquid organic scintillator
    Satoh, Daiki
    Sato, Tatsuhiko
    JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2022, 59 (08) : 1047 - 1060
  • [24] Medical application of particle and heavy ion transport code system PHITS
    Takuya Furuta
    Tatsuhiko Sato
    Radiological Physics and Technology, 2021, 14 : 215 - 225
  • [25] Recent Improvements of Particle and Heavy Ion Transport code System: PHITS
    Sato, Tatsuhiko
    Niita, Koji
    Iwamoto, Yosuke
    Hashimoto, Shintaro
    Ogawa, Tatsuhiko
    Furuta, Takuya
    Abe, Shin-ichiro
    Kai, Takeshi
    Matsuda, Norihiro
    Okumura, Keisuke
    Kai, Tetsuya
    Iwase, Hiroshi
    Sihver, Lembit
    ICRS-13 & RPSD-2016, 13TH INTERNATIONAL CONFERENCE ON RADIATION SHIELDING & 19TH TOPICAL MEETING OF THE RADIATION PROTECTION AND SHIELDING DIVISION OF THE AMERICAN NUCLEAR SOCIETY - 2016, 2017, 153
  • [26] Medical application of particle and heavy ion transport code system PHITS
    Furuta, Takuya
    Sato, Tatsuhiko
    RADIOLOGICAL PHYSICS AND TECHNOLOGY, 2021, 14 (03) : 215 - 225
  • [27] Heavy ion-induced digital single-event transients in deep submicron processes
    Benedetto, J
    Eaton, P
    Avery, K
    Mavis, D
    Gadlage, M
    Turflinger, T
    Dodd, PE
    Vizkelethyd, G
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (06) : 3480 - 3485
  • [28] Particle and Heavy Ion Transport code System, PHITS, version 2.52
    Sato, Tatsuhiko
    Niita, Koji
    Matsuda, Norihiro
    Hashimoto, Shintaro
    Iwamoto, Yosuke
    Noda, Shusaku
    Ogawa, Tatsuhiko
    Iwase, Hiroshi
    Nakashima, Hiroshi
    Fukahori, Tokio
    Okumura, Keisuke
    Kai, Tetsuya
    Chiba, Satoshi
    Furuta, Takuya
    Sihver, Lembit
    JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2013, 50 (09) : 913 - 923
  • [29] ANALYSIS OF CELL-SURVIVAL FRACTIONS FOR HEAVY-ION IRRADIATIONS BASED ON MICRODOSIMETRIC KINETIC MODEL IMPLEMENTED IN THE PARTICLE AND HEAVY ION TRANSPORT CODE SYSTEM
    Sato, T.
    Watanabe, R.
    Kase, Y.
    Tsuruoka, C.
    Suzuki, M.
    Furusawa, Y.
    Niita, K.
    RADIATION PROTECTION DOSIMETRY, 2011, 143 (2-4) : 491 - 496
  • [30] Benchmark study of particle and heavy-ion transport code system using shielding integral benchmark archive and database for accelerator-shielding experiments
    Iwamoto, Yosuke
    Hashimoto, Shintaro
    Sato, Tatsuhiko
    Matsuda, Norihiro
    Kunieda, Satoshi
    Celik, Yurdunaz
    Furutachi, Naoya
    Niita, Koji
    JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 2022, 59 (05) : 665 - 675
12345