Investigation of Low-Voltage, Sub-threshold Charge Pump with Parasitics Aware Design Methodology

被引:0
|
作者
Kovac, Martin [1 ]
Arbet, Daniel [1 ]
Stopjakova, Viera [1 ]
Sovcik, Michal [1 ]
Nagy, Lukas [1 ]
机构
[1] Slovak Univ Technol Bratislava, Dept IC Design & Test, Bratislava, Slovakia
关键词
ultra low-voltage design; cross-coupled charge pump; dynamic threshold; optimization; EKV model;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper deals with cross-implementation of analytical and physical fundamentals of ultra low-voltage charge pumps. The analysis is based on precise, general formulas including characteristic parasitic effects valid for linear charge pumps. The parasitic effects are extended by non-linear parasitic capacitances represented as equivalent linear model of a switched transistor itself. The discussion about non-linear and linear behaviour of these parasitics is also included and demonstrated using cross-coupled, dynamic threshold implementation, where the EKV model of transistors has been utilized. The paper also introduced a new design rule for design of charge pumps based on transistors working in sub-threshold region to maximize the power throughput. This is achieved by tuning the operation conditions to the boundary case.
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页数:4
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