THE POPULATION OF TWIN RELATED BOUNDARIES IN HIGH PURITY NICKEL AS MEASURED WITH NEAR-FIELD HIGH ENERGY X-RAY DIFFRACTION MICROSCOPY

被引：0

作者：

Hefferan, C. M. ^{[1
]}

Li, S. F. ^{[2
]}

Lind, J. ^{[2
]}

Pokharel, R. ^{[3
]}

Lienert, U. ^{[4
]}

Rollett, A. D. ^{[5
]}

Suter, R. M. ^{[5
]}

机构：

[1] RJ Lee Grp Inc, 350 Hochberg Rd, Monroeville, PA 15146 USA

[2] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[3] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

[4] Deutsch Elektronen Synchrotron DESY, Hamburg, Germany

[5] Carnegie Mellon Univ, Pittsburgh, PA 15213 USA

来源：

8TH INTERNATIONAL SYMPOSIUM ON SUPERALLOY 718 AND DERIVATIVES | 2014年

关键词：

twin boundary; high energy X-ray diffraction microscopy; forward modeling orientation reconstruction; Brandon criterion; STRESS-CORROSION CRACKING; GRAIN; CHARACTER;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The ability of near-field High Energy X-ray Diffraction Microscopy (nf-HEDM) to map the dynamic response of microstructures under the influence of thermo-mechanical loads has been repeatedly demonstrated. Here, we use nf-HEDM to monitor the evolution of the same high purity, polycrystalline nickel microstructure through a sequence of five, grain growth anneal states. While the microstructure coarsens in response to the applied heat, the boundary misorientation distribution was found to be both static and consistent with that of a twinned microstructure. Analysis of the Sigma 3(n) grain boundaries shows that in addition to accounting for a large proportion of the grain boundary area, these twin related boundaries also exhibit minimal deviation from the ideal Sigma 3(n) configuration.

引用

页码：885 / 896

页数：12

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