Phase calibration of spatially nonuniform spatial light modulators

被引:111
作者
Xun, XD [1 ]
Cohn, RW
机构
[1] Univ Louisville, ElectroOpt Res Inst, Louisville, KY 40292 USA
[2] Univ Louisville, Nanotechnol Ctr, Louisville, KY 40292 USA
关键词
D O I
10.1364/AO.43.006400
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new 512 X 512 pixel phase-only spatial light modulator (SLM) has been found to deviate from being flat by several wavelengths. Also, the retardation of the SLM relative to voltage varies across the device by as much as 0.25 wavelength. The birefringence of each pixel as a function of address voltage is measured from the intensity of the SLM between crossed polarizers. To these responses are added a reference spatial phase measured by phase shifting interferometry for a single address voltage. Fits to the measured data facilitate the compensation of the SLM to a root-mean-square wave-front error of 0.06 wavelength. The application of these corrections to flatten the full aperture of the SLM sharpens the focal plane spot and reduces the distortion of computer-designed diffraction patterns. (C) 2004 Optical Society of America.
引用
收藏
页码:6400 / 6406
页数:7
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