Approximate self-affine characterization of two-point rough surface statistics simulated by Eden algorithm

被引：6
作者：
Vulkova, LA
Atanasov, IS
Yordanov, OI
机构：
[1] Bulgarian Acad Sci, Inst Elect, BU-1784 Sofia, Bulgaria
[2] American Univ Bulgaria, Blagoevgrad 2700, Bulgaria
来源：
VACUUM | 2000年 / 58卷 / 2-3期
关键词：
semi-empirical models and model calculations; surface structure; morphology; roughness; topography;
D O I：
10.1016/S0042-207X(00)00164-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We study the self-affine properties of growing surfaces generated by using version A of the Eden model (R. Jullien and R, Botet, J Phys A:Math Gen 1985;18:2279). The analysis is based on two-point surface statistical quantities. A three-segmented spectral model is suggested and shown to be in agreement with the data related to the sample autocovariance function at all stages of the growth. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：158 / 165
页数：8
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