Investigation of stress singularity fields and stress intensity factors for cracks

被引：0

作者：

Amagai, M ^{[1
]}

机构：

[1] TEXAS INSTRUMENTS JAPAN,NEW PACKAGE DEV DEPT,OITA 87915,JAPAN

来源：

1996 IEEE INTERNATIONAL RELIABILITY PHYSICS PROCEEDINGS, 34TH ANNUAL | 1996年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：246 / 257

页数：2

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