Evaluating Statistical Targets for Assembling Parallel Mixed-Format Test Forms

被引:5
作者
Debeer, Dries [1 ]
Ali, Usama S. [2 ,3 ]
van Rijn, Peter W. [4 ]
机构
[1] Univ Zurich, Dept Psychol, Res Unit Psychol Methods Evaluat & Stat, Binzmuehlestr 14 PB 27, CH-8050 Zurich, Switzerland
[2] Educ Testing Serv, 666 Rosedale Rd, Princeton, NJ 08541 USA
[3] South Valley Univ, Dept Educ Psychol, Qena, Egypt
[4] ETS Global, Strawinskylaan 929, NL-1077 XX Amsterdam, Netherlands
关键词
PARTIAL CREDIT MODEL; ITEM SELECTION; INFORMATION; ALGORITHM;
D O I
10.1111/jedm.12142
中图分类号
G44 [教育心理学];
学科分类号
0402 ; 040202 ;
摘要
Test assembly is the process of selecting items from an item pool to form one or more new test forms. Often new test forms are constructed to be parallel with an existing (or an ideal) test. Within the context of item response theory, the test information function (TIF) or the test characteristic curve (TCC) are commonly used as statistical targets to obtain this parallelism. In a recent study, Ali and van Rijn proposed combining the TIF and TCC as statistical targets, rather than using only a single statistical target. In this article, we propose two new methods using this combined approach, and compare these methods with single statistical targets for the assembly of mixed-format tests. In addition, we introduce new criteria to evaluate the parallelism of multiple forms. The results show that single statistical targets can be problematic, while the combined targets perform better, especially in situations with increasing numbers of polytomous items. Implications of using the combined target are discussed.
引用
收藏
页码:218 / 242
页数:25
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