Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators

被引：21
作者：
LaLumondiere, SD
Koga, R
Yu, P
Maher, MC
Moss, SC
机构：
[1] Aerosp Corp, Los Angeles, CA 90009 USA
[2] Natl Semicond Corp, Portland, ME 04106 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2002年 / 49卷 / 06期
关键词：
analog; comparator; laser; linear; picosecond; single event transient (SET);
D O I：
10.1109/TNS.2002.805414
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have measured the single-event transient (SET) response for a number of 139-type comparators with differing topologies. In this paper, we present the results from pulsed laser measurements on a number of different 139-type devices, as well as heavy ion measurements on a new RM139 device from NSC. Devices tested with the laser included the HS-139H, PM139, LM139 and a more recent version. of LM139 from NSC. We discuss the effects of different device topologies on SET sensitivity. Our results agree qualitatively with SPICE model calculations of LM139s by Johnston et al.
引用
收藏
页码：3121 / 3128
页数：8
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