Material and device properties of Cu(In,Ga)Se2 deposited in-line at different deposition temperatures

被引:0
作者
Lammer, M [1 ]
Eicke, A [1 ]
Powalla, M [1 ]
机构
[1] Zentrum Sonnenergie & Wasserstoff Forsch, D-70565 Stuttgart, Germany
来源
CONFERENCE RECORD OF THE TWENTY-NINTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002 | 2002年
关键词
D O I
10.1109/PVSC.2002.1190660
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We investigated the influence of decreased deposition temperature and sodium content on in-line deposited Cu(In,Ga)Se-2. CIGS thin-films were prepared at T-Dep=420degreesC and Na was co-evaporated during CIGS deposition. Structural and electrical characterisation was performed and results were compared with standard films and devices prepared at T-Dep.=550degreesC. For T-Dep.=420degreesC, Na diffusion from the substrate is suppressed, leading to high resistivity and low energy conversion efficiency as well as to a less pronounced (112) preferential orientation and smaller grains. Na co-evaporation compensates for reduced Na diffusion from the substrate at low deposition temperatures and benefits resistivity and solar cell output parameters. However, a loss of current density at longer wavelengths is detected for low temperature devices. Using an optimised Na co-evaporation process, these losses can be reduced but not totally avoided.
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收藏
页码:696 / 699
页数:4
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