Implementation of a short-tip tapping-mode tuning fork near-field scanning optical microscope

被引:9
作者
Lu, NH [1 ]
Huang, CW
Chen, CY
Yu, CF
Kao, TS
Fu, YH
Tsai, DP
机构
[1] De Lin Inst Technol, Dept Elect Engn, Tuchen 23646, Taipei County, Taiwan
[2] Natl Taiwan Univ, Dept Phys, Taipei, Taiwan
[3] Natl Taiwan Normal Univ, Dept Phys, Taipei 117, Taiwan
[4] Natl Taiwan Ocean Univ, Inst Optoelect Sci, Chilung, Taiwan
来源
JOURNAL OF MICROSCOPY-OXFORD | 2003年 / 209卷
关键词
near-field scanning optical microscopy; short tip; tapping-mode; tuning fork;
D O I
10.1046/j.1365-2818.2003.01135.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
We present the implementation of a short-tip tapping-mode tuning fork near-field scanning optical microscope. Tapping frequency dependences of the piezoelectric signal amplitudes for a bare tuning fork fixed on the ceramic plate, a short-tip tapping-mode tuning fork scheme and an ordinary tapping-mode tuning fork configuration with an 80-cm optical fibre attached are demonstrated and compared. Our experimental results show that this new short-tip tapping-mode tuning fork scheme provides a stable and high Q factor at the tapping frequency of the tuning fork and will be very helpful when long optical fibre probes have to be used in an experiment. Both collection and excitation modes of short-tip tapping-mode tuning fork near-field scanning optical microscope are applied to study the near-field optical properties of a single-mode telecommunication optical fibre and a green InGaN/GaN multiquantum well light-emitting diode.
引用
收藏
页码:205 / 208
页数:4
相关论文
共 21 条
[1]   Dynamic force microscopy in superfluid helium [J].
Callaghan, FD ;
Yu, X ;
Mellor, CJ .
APPLIED PHYSICS LETTERS, 2002, 81 (05) :916-918
[2]   Ultra stable tuning fork sensor for low-temperature near-field spectroscopy [J].
Crottini, A ;
Staehli, JL ;
Deveaud, B ;
Wang, XL ;
Ogura, M .
ULTRAMICROSCOPY, 2002, 90 (2-3) :97-101
[3]   A near-field scanning optical microscope with a high Q-factor piezoelectric sensing element [J].
Davydov, DN ;
Shelimov, KB ;
Haslett, TL ;
Moskovits, M .
APPLIED PHYSICS LETTERS, 1999, 75 (12) :1796-1798
[4]   Near-field optical photoluminescence microscopy of high-density InAs/GaAs single quantum dots [J].
Eah, SK ;
Jhe, W ;
Arakawa, Y .
APPLIED PHYSICS LETTERS, 2002, 80 (15) :2779-2781
[5]   Near-field spectroscopy of a gated electron gas: A direct evidence for electron localization [J].
Eytan, G ;
Yayon, Y ;
Rappaport, M ;
Shtrikman, H ;
Bar-Joseph, I .
PHYSICAL REVIEW LETTERS, 1998, 81 (08) :1666-1669
[6]   Quantitative determination of the local Kerr rotation by scanning near-field magneto-optic microscopy [J].
Fumagalli, P ;
Rosenberger, A ;
Eggers, G ;
Munnemann, A ;
Held, N ;
Guntherodt, G .
APPLIED PHYSICS LETTERS, 1998, 72 (22) :2803-2805
[7]   Atomic resolution on Si(111)-(7x7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork [J].
Giessibl, FJ .
APPLIED PHYSICS LETTERS, 2000, 76 (11) :1470-1472
[8]  
GUTHNER P, 1989, APPL PHYS B, V48, P89
[9]   Near-field scanning optical nanolithography using amorphous silicon photoresists [J].
Herndon, MK ;
Collins, RT ;
Hollingsworth, RE ;
Larson, PR ;
Johnson, MB .
APPLIED PHYSICS LETTERS, 1999, 74 (01) :141-143
[10]   III-nitrides: Growth, characterization, and properties [J].
Jain, SC ;
Willander, M ;
Narayan, J ;
Van Overstraeten, R .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (03) :965-1006