Atomic layer deposition of atomic mirror for silicon

被引:0
作者
Fujimoto, T. [1 ]
Shiomi, Y. [1 ]
Kumagai, H. [1 ]
Kobayashi, A. [1 ]
机构
[1] Osaka City Univ, Grad Sch Engn, 3-3-138 Sugimoto, Osaka, Osaka 5588585, Japan
来源
PHOTON PROCESSING IN MICROELECTRONICS AND PHOTONICS VI | 2007年 / 6458卷
关键词
atomic layer deposition; atomic mirror; silicon; evanescent wave; aluminum oxide; titanium oxide;
D O I
10.1117/12.699991
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
There have been significant progresses in atom optics utilizing laser cooling techniques in recent years. Among them, we have been interested in an atomic mirror for silicon which can reflect silicon atoms. The atomic mirror consists of two layers on a sapphire substrate, and then atoms are reflected by the dipole forces from evanescent waves caused by the light reflected internally and totally at the interface of different refractive indices. In this study, we have constructed some structures of the atomic mirror. We tried atomic layer deposition techniques for preparation of both Al2O3 and TiO2 thin films, whose surface and interface roughnesses are well suppressed. In order to achieve the predicted enhancement of the evanescent waves, atomic layer deposition of the layer with the higher refractive index is especially important. It has found that absorption can be suppressed considerably by adding Al(CH3)(3) precursor gas to the alternate introducing cycle of TiCl4 and H2O2 precursor gases. We use this effect which can improve homogeneity and flatness of layers significantly, to design an atomic mirror using atomic layer deposition.
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页数:6
相关论文
共 16 条
[1]   ATOM OPTICS [J].
ADAMS, CS ;
SIGEL, M ;
MLYNEK, J .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1994, 240 (03) :143-210
[2]  
BALYKIN VI, 1987, JETP LETT+, V45, P353
[3]  
COOK RJ, 1982, OPT COMMUN, V43, P258, DOI 10.1016/0030-4018(82)90392-3
[4]   SURFACE-PLASMON MIRROR FOR ATOMS [J].
ESSLINGER, T ;
WEIDEMULLER, M ;
HEMMERICH, A ;
HANSCH, TW .
OPTICS LETTERS, 1993, 18 (06) :450-452
[5]   LOW-TEMPERATURE GROWTH OF THIN-FILMS OF AL2O3 BY SEQUENTIAL SURFACE CHEMICAL-REACTION OF TRIMETHYLALUMINUM AND H2O2 [J].
FAN, JF ;
SUGIOKA, K ;
TOYODA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1991, 30 (6B) :L1139-L1141
[6]   SEQUENTIAL SURFACE CHEMICAL-REACTION LIMITED GROWTH OF HIGH-QUALITY AL2O3 DIELECTRICS [J].
HIGASHI, GS ;
FLEMING, CG .
APPLIED PHYSICS LETTERS, 1989, 55 (19) :1963-1965
[7]   RESONANT ENHANCEMENT OF EVANESCENT WAVES WITH A THIN DIELECTRIC WAVE-GUIDE [J].
KAISER, R ;
LEVY, Y ;
VANSTEENKISTE, N ;
ASPECT, A ;
SEIFERT, W ;
LEIPOLD, D ;
MLYNEK, J .
OPTICS COMMUNICATIONS, 1994, 104 (4-6) :234-240
[8]   Preparation and characteristics of nickel oxide thin film by controlled growth with sequential surface chemical reactions [J].
Kumagai, H ;
Matsumoto, M ;
Toyoda, K ;
Obara, M .
JOURNAL OF MATERIALS SCIENCE LETTERS, 1996, 15 (12) :1081-1083
[9]   FABRICATION OF TITANIUM-OXIDE THIN-FILMS BY CONTROLLED GROWTH WITH SEQUENTIAL SURFACE CHEMICAL-REACTIONS [J].
KUMAGAI, H ;
MATSUMOTO, M ;
TOYODA, K ;
OBARA, M ;
SUZUKI, M .
THIN SOLID FILMS, 1995, 263 (01) :47-53
[10]   IN-SITU ELLIPSOMETRIC DIAGNOSTICS FOR CONTROLLED GROWTH OF METAL-OXIDES WITH SURFACE CHEMICAL-REACTIONS [J].
KUMAGAI, H ;
TOYODA, K .
APPLIED SURFACE SCIENCE, 1994, 82-3 (1-4) :481-486