Influence of interface bonds and buffer materials on optical properties of InAs/AlSb quantum wells grown on GaAs substrates

被引:4
|
作者
Ohtani, K [1 ]
Sato, A [1 ]
Ohno, Y [1 ]
Matsukura, F [1 ]
Ohno, H [1 ]
机构
[1] Tohoku Univ, Elect Commun Res Inst, Lab Elect Intelligent Syst, Aoba Ku, Sendai, Miyagi 9808577, Japan
基金
日本学术振兴会;
关键词
interface bends; buffer layer; photoluminescence; X-ray diffraction; InAs/AlSb multiquantum wells;
D O I
10.1016/S0169-4332(00)00106-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Optical properties of InAs/AlSb multiquantum wells (MQWs) epitaxially grown on GaAs substrates with a buffer laver are shown to be dependent on the type of the interface bond and the buffer layer material. Combinations of the two possible interface bond configurations (In-Sb and AI-As) with the two buffer layer materials (InAs and AlSb) were prepared by molecular beam epitaxy. The photoluminescence intensity (PL) of MQWs was considerably higher for two kinds of structures: (1) the In-Sb bond with the AlSb buffer or (2) the Al-As bond with the InAs buffer. The two other possible combinations resulted in a drastically reduced PL intensity. X-ray diffraction (XRD) measurements revealed that lattice matching between the average lattice constant of MQW and the buffer layer plays a key role in determining the PL intensity. (C) 2000 Published by Elsevier Science B.V. PACS: 81.10; 61.43; 78.60; 78.66; 61.10.N.
引用
收藏
页码:313 / 317
页数:5
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