Critical issues in the formation of atomic arrays of phosphorus in silicon for the fabrication of a solid-state quantum computer

被引:7
作者
Curson, NJ [1 ]
Schofield, SR [1 ]
Simmons, MY [1 ]
Oberbeck, L [1 ]
Clark, RG [1 ]
机构
[1] Univ New S Wales, Ctr Quantam Comp Technol, Sch Phys, Sydney, NSW 2052, Australia
关键词
auger electron spectroscopy; scanning tunneling microscopy; adsorption kinetics; surface diffusion; surface structure; morphology; roughness; and topography; silicon; phosphine; solid-gas interfaces;
D O I
10.1016/S0039-6028(03)00206-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We present recent progress towards the fabrication of a silicon-based quantum computer, via a 'bottom up' strategy, which exploits a combination of scanning tunneling microscopy (STM) and molecular beam epitaxy. Following our recent success in the fabrication of an atomic array of P atoms in silicon we now address the critical issues leading to the encapsulation of this array in silicon. Exposing Si(0 0 1) to a low PH3 dose at room temperature results in the formation of a number of species on the surface. We use bias dependent STM to characterise these species and identify PHx (x = 2, 3) moieties and hemihydrides as the dominant surface adsorbates. We show that by controlled annealing we can incorporate single P atoms into the surface layer. We use STM lithography to depassivate regions of a H:Si(0 0 1) surface in order to confine the above adsorption/incorporation processes to nanometer sized areas. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:678 / 684
页数:7
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