Accurate determination of domain boundary orientation in LaNbO4

被引：33
作者：
Prytz, O
Tafto, J
机构：
[1] Univ Oslo, Ctr Mat Sci & Nanotechnol, N-0318 Oslo, Norway
[2] Univ Oslo, Dept Phys, N-0316 Oslo, Norway
来源：
ACTA MATERIALIA | 2005年 / 53卷 / 02期
关键词：
high-resolution electron microscopy; electron diffraction; X-ray diffraction; ceramics; interface structure;
D O I：
10.1016/j.actamat.2004.09.023
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The orientation relationship between ferroelastic domains in LaNbO4 (with 0.5 at.% Sr) is studied by selected area electron diffraction and highly-resolution electron microscopy. At room temperature the domains are related through a simple rotation of approximately 95degrees about the monoclinic [0 1 0] axis, and the interface between two adjacent domains is highly ordered. The domain boundary is found to be the (2 0 -5.10)/(5.10 0 2) planes of the two domains, in excellent agreement with our theoretical predictions. This orientation differs considerably from that predicted by more elaborate ferroelastic theory. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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收藏
页码：297 / 302
页数：6
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