Spherical aberration corrector using space charge

被引:6
作者
Chao, LC
Orloff, J [1 ]
Wang, L
机构
[1] Univ Maryland, Inst Plasma Res, College Pk, MD 20742 USA
[2] Schlumberger Corp, ATE Div, San Jose, CA USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1997年 / 15卷 / 06期
关键词
D O I
10.1116/1.589717
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have investigated the use of space charge for the correction of spherical aberration in focused ion beam systems. A negative space charge cloud can be formed to reduce the spherical aberration of a lens for ions or for electrons, depending on the details of the space charge distribution. Spherical aberration is important in focused ion beam applications where large aperture angles are needed to obtain high beam currents used for milling or deposition, because it results in large tails on the current density distribution. A space charge distribution (cloud) can be produced with a small electron gun inside an electrostatic lens that can reduce this problem. We report on the properties of one such design. (C) 1997 American Vacuum Society.
引用
收藏
页码:2732 / 2736
页数:5
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