Overall characterization of assembled optical storage devices with a heterodyne microscope: a qualitative comparison with a confocal microscope

被引：0

作者：

Mauricio Flores, J. ^{[1
]}

Cywiak, Moises ^{[1
]}

Mendoza, Fernando ^{[1
]}

机构：

[1] Ctr Invest Opt AC, Guanajuato 37150, Mexico

来源：

APPLIED OPTICS | 2010年 / 49卷 / 01期

关键词：

D O I：

10.1364/AO.49.000050

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present local profile measurements of inner mirrorlike and external front-end polycarbonate surfaces at the same spot of assembled optical storage devices, a CD and a DVD, performed with a heterodyne scanning interferometer that uses Gaussian beams. We show that the heterodyne interferometer can reproduce the profiles of both surfaces with accurate precision. We describe a procedure for calibrating the instrument based on the measurement of reflecting calibrated gratings. To show the advantages that the heterodyne interferometer represents as a valuable tool for the characterization of optical disks, we include a comparison of experimental results obtained with a confocal microscope under similar working conditions. (C) 2009 Optical Society of America

引用

页码：50 / 55

页数：6

共 12 条

[1] Imaging of spheres and surface profiling by confocal microscopy [J].