Identification of quantitative trait loci controlling resistance to maize chlorotic dwarf virus

被引：26
作者：
Jones, MW
Redinbaugh, MG [1 ]
Anderson, RJ
Louie, R
机构：
[1] Ohio State Univ, Ohio Agr Res & Dev Ctr, Dept Plant Pathol, Wooster, OH 44691 USA
[2] Ohio State Univ, Ohio Agr Res & Dev Ctr, USDA, ARS Corn & Soybean Res, Wooster, OH 44691 USA
来源：
THEORETICAL AND APPLIED GENETICS | 2004年 / 110卷 / 01期
关键词：
D O I：
10.1007/s00122-004-1757-y
中图分类号：
S3 [农学（农艺学）];
学科分类号：
0901 ;
摘要：
Ineffective screening methods and low levels of disease resistance have hampered genetic analysis of maize (Zea mays L.) resistance to disease caused by maize chlorotic dwarf virus (MCDV). Progeny from a cross between the highly resistant maize inbred line Oh1VI and the susceptible inbred line Va35 were evaluated for MCDV symptoms after multiple virus inoculations, using the viral vector Graminella nigrifrons. Symptom severity scores from three rating dates were used to calculate area under the disease progress curve (AUDPC) scores for vein banding, leaf twist and tear, and whorl chlorosis. AUDPC scores for the F-2 population indicated that MCDV resistance was quantitatively inherited. Genotypic and phenotypic analyses of 314 F-2 individuals were compared using composite interval mapping (CIM) and analysis of variance. CIM identified two major quantitative trait loci (QTL) on chromosomes 3 and 10 and two minor QTL on chromosomes 4 and 6. Resistance was additive, with alleles from Oh1VI at the loci on chromosomes 3 and 10 contributing equally to resistance.
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页码：48 / 57
页数：10
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