Characterizing the local vectorial electric field near an atom chip using Rydberg-state spectroscopy

被引:9
作者
Cisternas, N. [1 ]
de Hond, Julius [1 ]
Lochead, G. [1 ,2 ]
Spreeuw, R. J. C. [1 ]
van den Heuvell, H. B. van Linden [1 ]
van Druten, N. J. [1 ]
机构
[1] Univ Amsterdam, Inst Phys, Van der Waals Zeeman Inst, Amsterdam, Netherlands
[2] Heidelberg Univ, Phys Inst, Heidelberg, Germany
基金
欧盟地平线“2020”;
关键词
QUANTUM;
D O I
10.1103/PhysRevA.96.013425
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We use the sensitive response to electric fields of Rydberg atoms to characterize all three vector components of the local electric field close to an atom-chip surface. We measured Stark-Zeeman maps of S and D Rydberg states using an elongated cloud of ultracold rubidium atoms (temperature T similar to 2.5 mu K) trapped magnetically 100 mu m from the chip surface. The spectroscopy of S states yields a calibration for the generated local electric field at the position of the atoms. The values for different components of the field are extracted from the more complex response of D states to the combined electric and magnetic fields. From the analysis we find residual fields in the two uncompensated directions of 0.0 +/- 0.2 and 1.98 +/- 0.09 V/cm. This method also allows us to extract a value for the relevant field gradient along the long axis of the cloud. The manipulation of electric fields and the magnetic trapping are both done using on-chip wires, making this setup a promising candidate to observe Rydberg-mediated interactions on a chip.
引用
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页数:7
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