Optical reflectance measurement of large-scale graphene layers synthesized on nickel thin film by carbon segregation

被引：12

作者：

Mun, Jeong Hun ^{[1
]}

Hwang, Chanyong ^{[2
]}

Lim, Sung Kyu ^{[3
]}

Cho, Byung Jin ^{[1
]}

机构：

[1] Korea Adv Inst Sci & Technol, Dept Elect Engn, Taejon 305701, South Korea

[2] Korea Res Inst Stand & Sci, Ctr Adv Instrumentat, Taejon 305600, South Korea

[3] Natl Nano Fab Ctr, Taejon 305701, South Korea

来源：

CARBON | 2010年 / 48卷 / 02期

关键词：

GRAPHITE; GAS;

D O I：

10.1016/j.carbon.2009.09.058

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The change of surface roughness during graphene synthesis on evaporated Ni thin films was monitored. It was found that Ni is highly agglomerated during high temperature annealing but the surface roughness is made smoother by the coverage of graphene. it is demonstrated that diffuse reflectance is a fast and convenient technique for evaluating surface roughness over a large area of graphene on a metal film, and specular reflectance is a good indicator of the coverage of graphene on the metal film. (C) 2009 Elsevier Ltd. All rights reserved,

引用

页码：447 / 451

页数：5

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