Properties of sputtered ZnS thin films for photovoltaic application

被引：17

作者：

Haque, Faiazul ^{[1
,4
]}

Rahman, Kazi Sajedur ^{[2
]}

Akhtaruzzaman, Md ^{[4
]}

Abdullah, Huda ^{[3
]}

Tiong Sieh Kiong ^{[2
]}

Amin, Nowshad ^{[2
]}

机构：

[1] Univ New South Wales, Sch Photovolta & Renewable Energy Engn, Sydney, NSW 2052, Australia

[2] Natl Energy Univ, Inst Sustainable Energy, Jalan IKRAM UNITEN, Kajang 43000, Selangor, Malaysia

[3] Natl Univ Malaysia, Fac Engn & Built Environm, Dept Elect Elect & Syst Engn, Bangi 43600, Selangor, Malaysia

[4] Natl Univ Malaysia, Solar Energy Res Inst, Bangi 43600, Selangor, Malaysia

来源：

MATERIALS RESEARCH EXPRESS | 2018年 / 5卷 / 09期

关键词：

ZnS thin films; sputtering; optical bandgap; XRD; SOLAR-CELL; BUFFER LAYER; OPTICAL-PROPERTIES; EFFICIENCY;

D O I：

10.1088/2053-1591/aad6c6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images.

引用

页数：9

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