Effects of trace rare earth Nd addition on microstructure and properties of SnAgCu solder

被引:59
作者
Gao, Lili [1 ]
Xue, Songbai [1 ]
Zhang, Liang [1 ]
Sheng, Zhong [1 ]
Zeng, Guang [1 ]
Ji, Feng [1 ]
机构
[1] Nanjing Univ Aeronaut & Astronaut, Coll Mat Sci & Technol, Nanjing 210016, Peoples R China
关键词
MECHANICAL-PROPERTIES; STRENGTH; ALLOY; RE; CU;
D O I
10.1007/s10854-009-9970-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Effects of rare earth Nd on solderability of the Sn3.8Ag0.7Cu alloy were studied by wetting balance method, and the mechanical properties (such as pull-force and shear-force) of the joints soldered with SnAgCu-XNd solders were determined using STR-1000 joint strength tester. Moreover, the microstructures of SnAgCu-XNd solders bearing different amount of Nd as well as the intermetallic compounds (IMCs) formed at solder/Cu interface during soldering have been investigated using optical microscopy, scanning electron microscopy and energy dispersive X-ray analysis, respectively. The results indicate that trace amount of Nd addition can remarkably improve the solderability and mechanical properties of SnAgCu solder. At the same time, it is found that rare earth Nd in SnAgCu solder could refine and improve microstructure of the solder, some bigger IMC plates in SnAgCu solder were replaced by fine granular IMCs. Moreover, the thickness of the intermetallic layer at the Cu/solder interface was reduced significantly. In summary, we suggest that the most suitable content of rare earth Nd is about 0.05 wt% and it will be inadvisable when the Nd exceeds 0.25 wt%.
引用
收藏
页码:643 / 648
页数:6
相关论文
共 18 条
[1]   Study on the microstructure of a novel lead-free solder alloy SnAgCu-RE and its soldered joints [J].
Chen, ZG ;
Shi, YW ;
Xia, ZD ;
Yan, YF .
JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (10) :1122-1128
[2]  
DeKock R. L., 1989, CHEM STRUCTURE BONDI, P91
[3]   Microstructure and mechanical behavior of novel rare earth-containing Pb-free solders [J].
Dudek, M. A. ;
Sidhu, R. S. ;
Chawla, N. ;
Renavikar, M. .
JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (12) :2088-2097
[4]   Properties of Sn3.8AgO.7Cu solder alloy with trace rare earth element Y additions [J].
Hao, H. ;
Tian, J. ;
Shi, Y. W. ;
Lei, Y. P. ;
Xia, Z. D. .
JOURNAL OF ELECTRONIC MATERIALS, 2007, 36 (07) :766-774
[5]   Metallurgical reaction and mechanical strength of electroless Ni-P solder joints for advanced packaging applications [J].
Hung, KC ;
Chan, YC ;
Tang, CW .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2000, 11 (08) :587-593
[6]   Effect of rare earth addition on shear strength of SnAgCu lead-free solder joints [J].
Li, Guangdong ;
Shi, Yaowu ;
Hao, Hu ;
Xia, Zhidong ;
Lei, Yongping ;
Guo, Fu ;
Li, Xiaoyan .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2009, 20 (02) :186-192
[7]   The microstructure and mechanical properties of permanent-mould cast Mg-5 wt%Sn-(0-2.6) wt%Di alloys [J].
Liu, Hongmei ;
Chen, Yungui ;
Tang, Yongbai ;
Huang, Deming ;
Niu, Gao .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2006, 437 (02) :348-355
[8]   Effect of La on the Cu-Sn intermetallic compound (IMC) growth and solder joint reliability [J].
Ma, X ;
Qian, YY ;
Yoshida, F .
JOURNAL OF ALLOYS AND COMPOUNDS, 2002, 334 :224-227
[9]   Effects of small amount addition of rare earth Er on microstructure and property of SnAgCu solder [J].
Shi, Yaowu ;
Tian, Jun ;
Hao, Hu ;
Xia, Zhidong ;
Lei, Yongping ;
Guo, Fu .
JOURNAL OF ALLOYS AND COMPOUNDS, 2008, 453 (1-2) :180-184
[10]   Effects of Ga, Al, Ag, and Ce multi-additions on the properties of Sn-9Zn lead-free solder [J].
Wang, Hui ;
Xue, Songbai ;
Zhao, Feng ;
Chen, Wenxue .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2010, 21 (02) :111-119