The effect of solvent and counterion variation on inverse micelle CMCs in hydrocarbon solvents

被引：28

作者：

Smith, Gregory N. ^{[1
,3
]}

Brown, Paul ^{[1
,4
]}

James, Craig ^{[1
,5
,6
]}

Rogers, Sarah E. ^{[2
]}

Eastoe, Julian ^{[1
]}

机构：

[1] Univ Bristol, Sch Chem, Cantocks Close, Bristol BS8 1TS, Avon, England

[2] Rutherford Appleton Lab, ISIS STFC, Didcot OX11 0QX, Oxon, England

[3] Univ Sheffield, Dept Chem, Brook Hill, Sheffield S3 7HF, S Yorkshire, England

[4] MIT, Dept Chem Engn, Cambridge, MA 02139 USA

[5] Univ Florence, Dept Chem, I-50019 Florence, Italy

[6] Univ Florence, CSGI, I-50019 Florence, Italy

来源：

COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS | 2016年 / 494卷

基金：

英国工程与自然科学研究理事会;

关键词：

Nonpolar solvents; Inverse micelles; Small-angle neutron scattering; ANGLE NEUTRON-SCATTERING; AOT-REVERSED MICELLES; AEROSOL OT; NONPOLAR-SOLVENTS; SURFACTANTS; LIQUIDS; POLAR;

D O I：

10.1016/j.colsurfa.2016.01.020

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Critical micelle concentrations (CMCs) for the formation of inverse micelles have been determined for anionic surfactants in nonpolar, hydrocarbon solvents. Sodium dioctylsulfosuccinate (Aerosol OT or AOT) was chosen as the model surfactant, with systematic variations in both the solvent (benzene, cyclohexane, and dodecane) and the surfactant counterion (sodium and tetrapropylammonium). Recent work (Langmuir 29 (2013) 3352-3258) has shown that high-resolution small-angle neutron scattering (SANS) measurements can be used to directly determine the presence or absence of aggregates in solution. No variation in the value of the CMC was found within the resolution of the measurements for changing either solvent or counterion; some effects on the structure of inverse micelles were observed. This lack of a significant difference in the onset of inverse micellization with changes to the molecular species is surprising, and the implications on the solvophobic effect in nonpolar solvents are discussed. (C) 2016 Elsevier B.V. All rights reserved.

引用

页码：194 / 200

页数：7

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