Precession electron diffraction and its utility for structural fingerprinting in the transmission electron microscope

被引：0
|
作者：
Moeck, Peter [1 ]
Rouvimov, Sergei [1 ]
Nicolopoulos, Stavros [2 ]
机构：
[1] Portland State Univ, Dept Phys, Nanocrystallog Grp, Portland, OR 97207 USA
[2] NanoMEGAS SPRL, B-1080 Brussels, Belgium
来源：
NANOTECH CONFERENCE & EXPO 2009, VOL 1, TECHNICAL PROCEEDINGS: NANOTECHNOLOGY 2009: FABRICATION, PARTICLES, CHARACTERIZATION, MEMS, ELECTRONICS AND PHOTONICS | 2009年
关键词：
precession electron diffraction (PED); nanocrystals; structural fingerprinting; IDENTIFICATION; INTENSITIES;
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Precession electron diffraction (PED) in a transmission electron microscope (TEM) is discussed in order to illustrate its utility for Structural fingerprinting of nanocrystals. While individual nanocrystals may be fingerprinted structurally from PED spot patterns, ensembles of nanocrystals may be fingerprinted from powder PED ring patterns.
引用
收藏
页码：417 / +
页数：2
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