Deformation and Ic degradation behavior in bent Bi-2223 tapes under pressurized liquid nitrogen

被引:4
作者
Shin, Hyung-Seop [1 ]
Dizon, John Ryan C.
Choi, Ho-Yeon
Kim, Seokho
Ha, Dong-Woo
Oh, Sang-Soo
机构
[1] Andong Natl Univ, Sch Mech Engn, Andong 760749, South Korea
[2] Andong Natl Univ, Dept Engn Mech, Grad Sch, Andong 760749, South Korea
[3] Korea Electrotechnol Res Inst, Appl Supercond Res Grp, Kyungnam 641120, South Korea
关键词
bending strain; Bi-2223; tapes; critical current; pressurized LN2;
D O I
10.1109/TASC.2005.864324
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The I-C degradation behaviors of Bi-2223 superconducting tapes under pressurized liquid nitrogen were investigated using a newly developed sample holder which gives a series of bending strains to a sample. Four kinds of commercially available multifilamentary Bi-2223 superconducting tapes were used. At atmospheric pressure, the I-C degradation behavior depended upon the reinforcement adopted, the tapes externally reinforced or densified by over pressure showed better bending strain tolerance than the Ag alloy-sheathed Bi-2223 tapes. But these tapes showed a larger I-C degradation when pressurized to 1 MPa in liquid nitrogen. For all samples, after depressurization to atmospheric pressure from 1 MPa, the I-C was completely recovered to its initial values at atmospheric pressure. When the samples were warmed up to room temperature after being depressurized from I MPa, ballooning occurred at some parts of some samples. It was found that the larger degradation of I-C occurred at the regions where significant ballooning occurred.
引用
收藏
页码:1051 / 1054
页数:4
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