Following the Kinetics of a Chemical Reaction in Ultrathin Supported Polymer Films by Reliable Mass Density Determination with X-ray Reflectivity

被引：32

作者：

Kontturi, Eero ^{[1
]}

Lankinen, Aapo ^{[2
]}

机构：

[1] Aalto Univ, Sch Sci & Technol, Dept Forest Prod Technol, Aalto 00076, Finland

[2] Aalto Univ, Sch Sci & Technol, Dept Micro & Nanosci, Aalto 00076, Finland

来源：

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY | 2010年 / 132卷 / 11期

基金：

芬兰科学院;

关键词：

THIN-FILMS; NEUTRON REFLECTIVITY; CELLULOSE; FORCE;

D O I：

10.1021/ja100669w

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Numerous modern functionalities with Ultrathin polymer films involve chemical reactions within the Films. X-ray reflectivity can be used to quantitatively follow these chemical reactions by a reliable determination of mass density, which is feasible within certain thickness constraints (e.g., 5-17 nm thickness for common polymer films).

引用

收藏

页码：3678 / +

页数：4

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