Electrode influence on the transport through SrRuO3/Cr-doped SrZrO3/metal junctions

被引:22
作者
Lee, Hwan-Soo [1 ]
Bain, James A.
Choi, Sukwon
Salvador, Paul A.
机构
[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA
[2] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2739081
中图分类号
O59 [应用物理学];
学科分类号
摘要
The authors have investigated the charge transport properties across heterostructures built from a SrRuO3 bottom electrode, a Cr-doped SrZrO3 perovskite film, and different top electrode metals (Pt, Cu, Ag, Cr, Mg, and SrRuO3). The resistances of such junctions were dependent on the top metal and ranging between 1 and 1000 k Omega. The observed I-V curves were modeled with the equation I(V)=aV+bV(2), where the variation of a with metal type was related to the work function while the variation of b was related to the oxygen affinity of the metal, consistent with space charge limited conduction through a defected interface. (C) 2007 American Institute of Physics.
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页数:3
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