Phase imaging atomic force microscopy in the characterization of biomaterials

被引:46
作者
Ye, Z. [1 ,2 ]
Zhao, X. [1 ,3 ]
机构
[1] Sichuan Univ, Inst NanoBiomed Technol & Membrane Biol, W China Hosp, Chengdu 610041, Sichuan, Peoples R China
[2] Peking Univ, Natl Lab Prot Engn & Plant Genet Engn, Coll Life Sci, Beijing 100871, Peoples R China
[3] MIT, Ctr Biomed Engn NE47 378, Cambridge, MA 02139 USA
基金
中国国家自然科学基金;
关键词
Height image; inherent roughness; multi-components; phase image; tapping mode; ENERGY-DISSIPATION; VISCOELASTIC PROPERTIES; CONTRAST; IMAGES; SHIFT; CONTACT; AFM;
D O I
10.1111/j.1365-2818.2009.03282.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
The phase imaging atomic force microscopy is a powerful tool in surface characterization of the biomaterials, and the resulting phase image is able to detect chemical variation and reveal more detailed surface properties than the morphological image. However, the chemical-and morphological-dependent phase images were still not distinguished well. In order to better understand actual occurring phase images, we examined non-carious human maxillary incisor, microphase separated polyurethane and self-assembling peptide nanofibres. We herein reported that phase image mainly plotted the morphological change: the phase peak corresponding to the morphological valley, and the morphological peak to the phase valley, and exhibited fine surface structures of materials. The chemical-dependent phase contrast was generally masked by their inherent roughness. For the sample being very rough and having great phase separation, its chemical-dependent phase contrast could be detected at the hard tapping mode ('Amp. Ref. "set point ratio"': -0.4 to -0.8), for the sample with medium roughness only at the light tapping mode ('Amp. Ref.': -0.1 to -0.4). These results will help us understand and determine actual occurring phase images of natural or fabricated biomaterials, even, other materials.
引用
收藏
页码:27 / 35
页数:9
相关论文
共 49 条
[1]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[2]   How to measure energy dissipation in dynamic mode atomic force microscopy [J].
Anczykowski, B ;
Gotsmann, B ;
Fuchs, H ;
Cleveland, JP ;
Elings, VB .
APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :376-382
[3]   Effect of viscoelastic properties of polymers on the phase shift in tapping mode atomic force microscopy [J].
Bar, G ;
Brandsch, R ;
Whangbo, MH .
LANGMUIR, 1998, 14 (26) :7343-7348
[4]   Examination of the relationship between phase shift and energy dissipation in tapping mode atomic force microscopy by frequency-sweep and force-probe measurements [J].
Bar, G ;
Brandsch, R ;
Bruch, M ;
Delineau, L ;
Whangbo, MH .
SURFACE SCIENCE, 2000, 444 (1-3) :L11-L16
[5]   Influence of volume and surface properties on phase contrast in tapping mode atomic force microscopy [J].
Berquand, A ;
Mazeran, PE ;
Laval, JM .
SURFACE SCIENCE, 2003, 523 (1-2) :125-130
[6]   Optimizing phase imaging via dynamic force curves [J].
Chen, X ;
Davies, MC ;
Roberts, CJ ;
Tendler, SJB ;
Williams, PM ;
Burnham, NA .
SURFACE SCIENCE, 2000, 460 (1-3) :292-300
[7]   Chemical and morphological analysis of surface enrichment in a biodegradable polymer blend by phase-detection imaging atomic force microscopy [J].
Chen, X ;
McGurk, SL ;
Davies, MC ;
Roberts, CJ ;
Shakesheff, KM ;
Tendler, SJB ;
Williams, PM ;
Davies, J ;
Dawkes, AC ;
Domb, A .
MACROMOLECULES, 1998, 31 (07) :2278-2283
[8]   Energy dissipation in tapping-mode atomic force microscopy [J].
Cleveland, JP ;
Anczykowski, B ;
Schmid, AE ;
Elings, VB .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615
[9]   Tip-sample interaction in tapping-mode scanning force microscopy [J].
de Pablo, PJ ;
Colchero, J ;
Luna, M ;
Gómez-Herrero, J ;
Baró, AM .
PHYSICAL REVIEW B, 2000, 61 (20) :14179-14183
[10]   Determining the interphase thickness and properties in polymer matrix composites using phase imaging atomic force microscopy and nanoindentation [J].
Downing, TD ;
Kumar, R ;
Cross, WM ;
Kjerengtroen, L ;
Kellar, JJ .
JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY, 2000, 14 (14) :1801-1812