Nanoscale Scanning Probe Thermometry of TaOx-based selector devices

被引：0
|
作者：
Li, Dasheng [1 ]
Ramer, Georg [2 ]
Yeoh, Phoebe [1 ]
Hoskins, Brian [2 ]
Ma, Yuanzhi [1 ]
Bain, James A. [1 ]
Centrone, Andrea [2 ]
Skowronski, Marek [1 ]
机构：
[1] Carnegie Mellon Univ, 5000 Forbes Ave, Pittsburgh, PA 15213 USA
[2] NIST, Ctr Nanoscale Sci & Technol, 100 Bur Dr, Gaithersburg, MD 20899 USA
来源：
2018 76TH DEVICE RESEARCH CONFERENCE (DRC) | 2018年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页数：2
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