Surface stability of MBE-grown Nd1.85Ce0.15CuO4 thin films in air investigated by RHEED, XPS, and UPS

被引：10

作者：

Yamamoto, H ^{[1
]}

Naito, M ^{[1
]}

Sato, H ^{[1
]}

机构：

[1] NTT, Basic Res Labs, Kanagawa 24301, Japan

来源：

PHYSICA C | 1997年 / 291卷 / 1-2期

关键词：

surface stability; MBE-grown Nd1.85Ce0.15CuO4 film; RHEED; XPS; UPS;

D O I：

10.1016/S0921-4534(97)01674-2

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

This paper reports on the stability of a Nd1.85Ce0.15CuO4 (NCCO) surface investigated by reflection high-energy electron diffraction (RHEED) and photoemission spectroscopy. Experiments were performed on an "intrinsic" surface prepared by molecular beam epitaxy (MBE). Ex situ observation of the time evolution of the MBE-grown NCCO surface showed that it is substantially more stable than previously reported, in that the sharp streaky RHEED patterns an maintained and the above 531 eV component in the O 1s X-ray photoelectron spectra develops only slightly even after exposure to air for two weeks. (C) 1997 Elsevier Science B.V.

引用

页码：67 / 72

页数：6

共 10 条

[1] INITIAL-STAGES OF DEGRADATION OF SUPERCONDUCTOR SURFACES - O-2, H2O, CO2, AND CO CHEMISORPTION ON LA2-XSRXCUO4 [J].