6-bit Step Attenuators for Phased-Array System With Temperature Compensation Technique

被引:15
作者
Yuan, Ye [1 ,2 ,3 ]
Mu, Shan-Xiang [1 ]
Guo, Yong-Xin [2 ,4 ]
机构
[1] Nanjing Univ Sci & Thchnol, Sch Elect & Opt Engn, Nanjing 210094, Jiangsu, Peoples R China
[2] Natl Univ Singapore, Suzhou Res Inst, Suzhou 215123, Peoples R China
[3] Chengdu CORPRO Technol Co Ltd, Chengdu 610093, Sichuan, Peoples R China
[4] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore
关键词
Attenuator; root mean square (RMS) error; SiGe BiCMOS; temperature compensation; CIRCUIT;
D O I
10.1109/LMWC.2018.2849224
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This letter presents 6-bit differential step attenuators on SiGe BiCMOS for K- and Ka-bands with temperature compensation technique. A temperature-variant voltage source (TVVS) is applied to source and drain terminals of the switch MOSFETs. on-state resistance of MOSFETs, therefore, remains stable with temperature variation. With this technique, the root mean square (RMS) attenuation error will be stabilized under different ambient temperatures. Two attenuators for K- and Ka-bands are fabricated using 0.13-mu m IBM 8XP SiGe BiCMOS process; both attenuators have a maximum attenuation of 31.5 dB with a step of 0.5 dB. The attenuator working at 15-18 GHz exhibits a maximum RMS attenuation error of 0.3 dB from -55 degrees C to 125 degrees C, whereas the attenuator working at 19-24 GHz shows a maximum RMS attenuation error of 0.5 dB. To the authors' best knowledge, for the first time, a TVVS is added to a 6-bit differential step attenuator to achieve consistent attenuation accuracy during thermal variation.
引用
收藏
页码:690 / 692
页数:3
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