Recombination: An important effect in multigap resistive plate chambers

被引:5
作者
Doroud, K. [1 ,2 ]
Afarideh, H. [2 ]
Hatzifotiadou, D. [3 ]
Rahighi, J. [2 ]
Williams, M. C. S. [3 ]
Zichichi, A. [3 ,4 ]
机构
[1] World Lab, Geneva, Switzerland
[2] Amir Kabir Univ Technol, Tehran, Iran
[3] Sezione Ist Nazl Fis Nucl, Bologna, Italy
[4] CERN, PH Dept, Geneva, Switzerland
关键词
Resistive plate chambers; Multigap; Simulation; Recombination; MRPC;
D O I
10.1016/j.nima.2009.09.055
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have simulated the gas avalanche in a multigap resistive plate chamber (MRPC). The results were then compared with our data from the MRPC [1]. Up to now, the total amount of charge produced in a gas gap is considered to be given by the total number of positive ions generated by the gas avalanches. However, the total charge generated by the simulation program is much too large and is in conflict with our data. Our data indicate that nearly 100% of the negative ions recombine with the positive ions. The recombination effect dramatically reduces the amount of charge in the gas gap: a very important feature for MRPC technology especially for the rate capability. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:649 / 653
页数:5
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