X-ray fluorescent signal formation by the film-substrate boundary

被引:0
作者
Zaitsev, SI [1 ]
Ushakov, NG [1 ]
Chukalina, MV [1 ]
机构
[1] Russian Acad Sci, Inst Microelect & Highly Pure Mat Technol Problem, Chernogolovka 142432, Russia
来源
IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA | 1997年 / 61卷 / 10期
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:2003 / 2006
页数:4
相关论文
共 50 条
  • [41] NONDISPERSIVE X-RAY FLUORESCENT ANALYSIS
    HASLER, MF
    KEMP, JW
    [J]. ANALYTICAL CHEMISTRY, 1953, 25 (03) : 524 - 524
  • [42] Fluorescent yield of X-ray emission
    Hevesy, G
    Lay, H
    [J]. NATURE, 1934, 134 : 98 - 99
  • [43] FLUORESCENT X-RAY EXCITATION EFFICIENCIES
    BIRKS, LS
    [J]. SPECTROCHIMICA ACTA, 1961, 17 (02): : 148 - 154
  • [44] NONMETALLIC FLUORESCENT X-RAY ANALYSIS
    KEMP, JW
    ANDERMANN, G
    [J]. ANALYTICAL CHEMISTRY, 1954, 26 (10) : 1665 - 1665
  • [45] MINIATURE FLUORESCENT X-RAY SPECTROGRAPH
    BIRKS, LS
    BROOKS, EJ
    [J]. ANALYTICAL CHEMISTRY, 1955, 27 (07) : 1147 - 1149
  • [46] X-RAY FLUORESCENT METHOD FOR ANALYSIS
    AFONIN, VP
    [J]. ZHURNAL VSESOYUZNOGO KHIMICHESKOGO OBSHCHESTVA IMENI D I MENDELEEVA, 1980, 25 (06): : 610 - 615
  • [47] Signal formation in amorphous-Se-based x-ray detectors
    Fourkal, E
    Lachaine, M
    Fallone, BG
    [J]. PHYSICAL REVIEW B, 2001, 63 (19):
  • [48] ANON - X-RAY FLUORESCENT SPECTROSCOPY
    MULLER, E
    [J]. CONTROL, 1967, 11 (107): : 249 - &
  • [49] FLUORESCENT SOURCES FOR X-RAY DIFFRACTOMETRY
    PARRISH, W
    LOWITZSCH, K
    SPIELBERG, N
    [J]. ACTA CRYSTALLOGRAPHICA, 1958, 11 (06): : 400 - 405
  • [50] Grain boundary diffusion of Cu in TiN film by X-ray photoelectron spectroscopy
    K.Y. Lim
    Y.S. Lee
    Y.D. Chung
    I.W. Lyo
    C.N. Whang
    J.Y. Won
    H.J. Kang
    [J]. Applied Physics A, 2000, 70 : 431 - 434