Ferroelectric and Ferroelastic Domain Wall Motion in Unconstrained Pb(Zr,Ti)O3 Microtubes and Thin Films

被引:6
作者
Bharadwaja, Srowthi S. N. [1 ]
Moses, Paul J. [1 ]
Trolier-McKinstry, Susan [4 ]
Mayer, Theresa S. [2 ]
Bettotti, Paolo [3 ]
Pavesi, Lorenzo [3 ]
机构
[1] Penn State Univ, Mat Res Inst, University Pk, PA 16802 USA
[2] Penn State Univ, Dept Elect Engn, University Pk, PA 16802 USA
[3] Univ Trento, Dept Phys, Povo, Italy
[4] Penn State Univ, WM Keck Smart Mat Integrat Lab, University Pk, PA 16802 USA
关键词
LEAD-ZIRCONATE-TITANATE; PIEZOELECTRIC RESPONSE; MACROPOROUS SILICON; DEPENDENCE; STRESS; SIZE;
D O I
10.1109/TUFFC.2010.1483
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
Ferroelectric polarization switching of high aspect ratio (>80:1) PbZr0.52Ti0.48O3 (PZT) microtubes with a wall thickness of similar to 200 nm was investigated. A charge-based technique was used to assess the dielectric and ferroelectric properties of individual mechanically-unconstrained PZT microtubes with interdigitated electrodes. An enhancement in the degree of ferroelastic (non-180 degrees) domain wall motion was observed in the tubes relative to films of similar thickness on rigid substrates. The dielectric response of the tubes showed a Rayleigh-like ac field dependence over a wide temperature range; the extent of the extrinsic contribution to the dielectric response dropped as the temperature approached 10K, but remained finite. This work demonstrates a general methodology for directly electrically addressing small, unconstrained ferroelectric devices, extending the range of driving fields and temperatures over which these materials can be probed.
引用
收藏
页码:792 / 800
页数:9
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