Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis

被引：0
|
作者：
Stellari, F [1 ]
Weger, AJ [1 ]
Song, PL [1 ]
McManus, MK [1 ]
机构：
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
来源：
ESSDERC 2004: PROCEEDINGS OF THE 34TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE | 2004年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this work we present a methodology based on the combination of Transmission Line Pulses (TLP) stimulation and Picosecond Imaging Circuit Analysis (PICA) for studying the dynamic onset of latchup. A mathematical model based on carrier recombination equations is also discussed and shows to be in very good agreement with experimental data.
引用
收藏
页码：205 / 208
页数：4
相关论文
共 50 条
  • [1] Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
    Weger, A
    Voldman, S
    Stellari, F
    Song, PL
    Sanda, P
    McManus, M
    41ST ANNUAL PROCEEDINGS: INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2003, : 99 - 104
  • [2] Picosecond imaging circuit analysis
    Tsang, JC
    Kash, JA
    Vallett, DP
    IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2000, 44 (04) : 583 - 603
  • [3] Picosecond imaging circuit analysis
    Tsang, James C.
    Kash, Jeffrey A.
    Vallett, David P.
    1600, IBM, Armonk, NY, United States (44):
  • [4] Propagation of picosecond pulses on superconducting transmission line interconnects *
    Talanov, Vladimir V.
    Knee, Derek
    Harms, David
    Perkins, Kieran
    Urbanas, Andrew
    Egan, Jonathan
    Herr, Quentin
    Herr, Anna
    SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 2022, 35 (05):
  • [5] PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis
    Mc Manus, MK
    Kash, JA
    Steen, SE
    Polonsky, S
    Tsang, JC
    Knebel, DR
    Huott, W
    MICROELECTRONICS RELIABILITY, 2000, 40 (8-10) : 1353 - 1358
  • [6] Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope
    Wessels, Teresa
    Daester, Simon
    Murooka, Yoshie
    Zingsem, Benjamin
    Migunov, Vadim
    Kruth, Maximilian
    Finizio, Simone
    Lu, Peng-Han
    Kovacs, Andras
    Oelsner, Andreas
    Mueller-Caspary, Knut
    Acremann, Yves
    Dunin-Borkowski, Rafal E.
    ULTRAMICROSCOPY, 2022, 233
  • [7] Invited - Picosecond Imaging Circuit Analysis of ULSI microprocessors
    Mc Manus, MK
    Song, PL
    2002 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2002, : 1505 - 1508
  • [8] Transmission Line Overloading Analysis Using Probabilistic Dynamic Line Rating
    Hajeforosh, SeyedeFatemeh
    Bollen, Math H. J.
    2020 INTERNATIONAL CONFERENCE ON PROBABILISTIC METHODS APPLIED TO POWER SYSTEMS (PMAPS), 2020,
  • [9] Distortion of Short Square Pulses by Transmission Line on Printed Circuit Board
    Sigmund, Milan
    Brancik, Lubomir
    2017 EUROPEAN CONFERENCE ON ELECTRICAL ENGINEERING AND COMPUTER SCIENCE (EECS), 2017, : 66 - 69
  • [10] Picosecond pulse transmission line for multi-beam ultrashort laser pulses sampling
    Chen, YX
    Yang, M
    Tang, D
    Deng, J
    Chen, MD
    CHINESE JOURNAL OF ELECTRONICS, 2005, 14 (04): : 731 - 734
12345