Evolution of dielectric permittivity under applied field in PLZT 8.3/70/30 ceramics

被引：2

作者：

Birks, E ^{[1
]}

Kundzinsh, M ^{[1
]}

Sternberg, A ^{[1
]}

机构：

[1] Univ Latvia, Inst Solid State Phys, LV-1063 Riga, Latvia

来源：

FERROELECTRICS | 2000年 / 240卷 / 1-4期

关键词：

diffused phase transition; dielectric permittivity; evolution in time;

D O I：

10.1080/00150190008227971

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The jump of dielectric permittivity as function of bias field applied after various duration of storage at the measurement temperature is investigated. The influence of storage time on epsilon(E=) depends on the value of bias field and frequency of measuring field. It is found that epsilon(E=) depends on the path of how particular field value is reached.

引用

页码：1465 / 1471

页数：7

共 6 条

[1]

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SHILNIKOV, A ;

STERNBERG, A .

FERROELECTRICS, 1989, 90 :39-43

[3]

JAMET JP, 1983, J PHYS LETT, V44, P257

[4] DIELECTRIC LONG-TIME RELAXATION AFTER REDUCING HYDROSTATIC-PRESSURE AT FERROELECTRICS WITH DIFFUSE PHASE-TRANSITION [J].

ROTH, P ;

HEGENBARTH, E .

FERROELECTRICS LETTERS SECTION, 1989, 10 (05) :125-132

[5]

SHILNIKOV A, 1988, FERROELECTRICS, V81, P317

[6]

SHULZE WA, 1978, J AM CERAM SOC, V61, P46

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