A generalized approach for atomic force microscopy image restoration with Bregman distances as Tikhonov regularization terms

被引:14
作者
Cidade, GAG
Anteneodo, C
Roberty, NC
Neto, AJS
机构
[1] Univ Fed Rio de Janeiro, COPPE, Nucl Engn Program, BR-21945970 Rio De Janeiro, Brazil
[2] Fed Univ Rio De Janeiro, CCS, Inst Biofis Carlos Chagas Filho, BR-21949900 Rio De Janeiro, Brazil
[3] Univ Estado Rio de Janeiro, Inst Politecn, BR-28601970 Nova Friburgo, RJ, Brazil
来源
INVERSE PROBLEMS IN ENGINEERING | 2000年 / 8卷 / 05期
关键词
image restoration; regularization; atomic force microscopy; biological sample;
D O I
10.1080/174159700088027741
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Tikhonov's regularization approach applied to image restoration, stated in terms of ill-posed problems, has proved to be a powerful tool to solve noisy and incomplete data. This work proposes a variable norm discrepancy function as the regularization term of a Tikhonov expression, where the cross-entropy functional was derived. Our method was applied to true Atomic Force Microscopy (AFM) images obtained from biological samples, producing satisfactory results towards the most probable sample morphological aspect. These images represent a mapping of local interaction forces exerted between a reduced scaled AFM sensing tip and the biological sample surface, kept alive in aqueous or air environment.
引用
收藏
页码:457 / 472
页数:16
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