Imaging of aerosols using time of flight secondary ion mass spectrometry

被引:16
|
作者
Palma, Carolina Font [1 ]
Evans, Greg J. [1 ]
Sodhi, Rana N. S. [1 ]
机构
[1] Univ Toronto, Dept Chem Engn & Appl Chem, Toronto, ON M5S 3E5, Canada
关键词
ToF-SIMS; SEM/EDX; VOAG; PCA; aerosols; imaging;
D O I
10.1016/j.apsusc.2006.12.126
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Interest in environmental aerosol chemistry has grown over the last decade as a result of its role in both climate change and troposheric pollution. in this work, the combination of ToF-SIMS and SEM/EDX was employed to explore the surface chemistry of aerosols. The capabilities and limitations of ToF-SIMS were investigated using particles of known composition and size produced by a vibrating orifice aerosol generator (VOAG). Principal component analysis (PCA) proved to help in the distinction of particles of different types by consolidating the information generated by ToF-SIMS. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:5951 / 5956
页数:6
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