Reliability of thick Al wire: A study of the effects of wire bonding parameters on thermal cycling degradation rate using non-destructive methods

被引:8
作者
Arjmand, E. [1 ]
Agyakwa, P. A. [1 ]
Johnson, C. M. [1 ]
机构
[1] Univ Nottingham, Dept Elect & Elect Engn, Nottingham NG7 2RD, England
基金
英国工程与自然科学研究理事会;
关键词
Wire bonding process parameters; Non-destructive methodology; Reliability; X-ray tomography; Passive thermal cycling; Power electronic modules;
D O I
10.1016/j.microrel.2014.07.119
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effect of bonding parameters on the reliability of thick Al wire bond is investigated. Samples were prepared with 25 different designs with 5 different bonding parameters such as time, ultrasonic power, begin-force, end-force and touch-down steps (pre-compression) with 5 levels. The bond signals of ultrasonic generator were collected during bonding in order to obtain prior quality information of bonded wires. 3D X-ray tomography was then used to evaluate bond quality during passive thermal cycling between -55 degrees C and -125 degrees C. Tomography datasets were obtained from the as-bonded condition and during cycling. The results clearly show ultrasonic power, appropriate levels of begin-force and touch-down steps are all important for achieving a well attached and reliable bond. Analysis of the virtual cross-sections indicates a good correlation between the bond signal (i.e. the initial bond quality) and wire bond damage/degradation rate. An improved understanding of the wire bonding process was achieved by observing the effect of the complex interaction of bonding parameters on the ultrasonic generator signals and degradation rate under thermal cycling. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2006 / 2012
页数:7
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