Chemical-looping combustion of simulated synthesis gas using nickel oxide oxygen carrier supported on bentonite

被引:59
作者
Siriwardane, Ranjani
Poston, James
Chaudhari, Karuna
Zinn, Anthony
Simonyi, Thomas
Robinson, Clark
机构
[1] US DOE, Natl Energy Technol Lab, Morgantown, WV 26507 USA
[2] Parsons Infrastructure & Technol Grp Inc, Morgantown, WV 26507 USA
关键词
D O I
10.1021/ef0604947
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Chemical-looping combustion (CLC) is a combustion technology for clean and efficient utilization of fossil fuels for energy production. This process which produces sequestration ready CO2 systems is a promising technology to be utilized with coal gasification systems. In the present work, chemical-looping combustion has been studied with an oxygen carrier, NiO/bentonite (60 wt % NiO) for the gasification systems utilizing simulated synthesis gas. Global reaction rates of reduction and oxidation as a function of conversion were calculated for oxidation-reduction cycles utilizing the thermogravimetric analysis (TGA) data on multicycle tests conducted with NiO/bentonite at atmospheric pressure between 700 and 900 degrees C. The rate of reduction increased slightly with an increase in temperature, while the rate of oxidation decreased at 900 degrees C. The effect of particle size of the oxygen carrier on CLC was studied for the particle size between 20 and 200 mesh. The rates of reactions depended on the particle size of the oxygen carrier. The smaller the particle size, the higher the reaction rates. The multicycle CLC tests conducted in a high-pressure flow reactor showed stable reactivity for the production of CO2 from fuel gas at 800 and 900 degrees C and full consumption of hydrogen during the reaction. The data from a one cycle test on the effect of the pressure on the performance with NiO/bentonite utilizing the tapered element oscillating microbalance (TEOM) showed a positive effect of the pressure on the global rates of reduction-oxidation reactions at higher fractional conversions. The X-ray diffraction (XRD) analysis confirmed the presence of the NiO phase in NiO/bentonite with the oxidized sample in the high-pressure reactor and Ni phase with the reduced sample. The presence of a small amount of NiO in the reduced sample detected by X-ray photoelectron spectroscopy (XPS) may be due to its exposure to air during sample transfer from the reactor to XPS. Scanning electron microscopy (SEM) analysis showed no significant changes in morphology of NiO/bentonite reacted in the temperature range 700-800 degrees C in an atmospheric TGA for 10 oxidation-reduction cycles, but some loss of surface area and porosity was observed at 900 degrees C. This effect was found to be greater with increase in the particle size of the oxygen carrier.
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收藏
页码:1582 / 1591
页数:10
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