Domain nucleation and relaxation kinetics in ferroelectric thin films

被引：82

作者：

Ganpule, CS ^{[1
]}

Nagarajan, V ^{[1
]}

Ogale, SB ^{[1
]}

Roytburd, AL ^{[1
]}

Williams, ED ^{[1
]}

Ramesh, R ^{[1
]}

机构：

[1] Univ Maryland, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 20期

关键词：

D O I：

10.1063/1.1322051

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The time-dependent relaxation of the remanent polarization in epitaxial lead zirconate titanate (PbZr0.2Ti0.8O3) ferroelectric thin films, containing a uniform two-dimensional grid of 90 degrees domains (c axis in the plane of the film), is examined using piezoresponse microscopy. The 90 degrees domain walls preferentially nucleate the 180 degrees reverse domains during relaxation, with a significant directional anisotropy. Relaxation occurs through the nucleation and growth of reverse domains, which subsequently coalesce and consume the entire region as a function of time. (C) 2000 American Institute of Physics. [S0003-6951(00)03444-6].

引用

页码：3275 / 3277

页数：3

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