Application of ICP-MS to the detection of heavy metals in transgenic corn

被引:0
|
作者
Rui Yu-kui
Guo Jing
Huang Kun-Lun
Jin Yin-hua
Luo Yun-bo [1 ]
机构
[1] China Agr Univ, Coll Food Sci & Nutr Engn, Beijing 100083, Peoples R China
[2] Minist Agr, Supervis Inspect & Test Ctr Farm Prod, Beijing 100083, Peoples R China
关键词
Transgenic food safety; ICP-MS; heavy metals;
D O I
暂无
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
With the rapid development of the transgenic food, more and more transgenic food has been pouring into the market, attracting much attention to the transgenic food's edible safety. Transgenic corns and its parents were studied by ICP-MS to detect the heavy metals. The results showed that the transgenic corn accumulated less heavy metals (Ni, Cu, Cd, As, Cr, Zn and Hg) than their own parents; and the contents of some heavy metals (V, Co and Pb) in transgenic corns were similar to their parents. All the data showed that the insertion of foreign gene (Bt) might change the absorbing dynamics of most heavy metals, especially some important heavy metals, which are disadvantageous to human health. The present paper indicated that the change in heavy metals absorption could harm the edible safety of transgenic plant. The cause of this change should be studied further.
引用
收藏
页码:796 / 798
页数:3
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