Reduction of CMOS Image Sensor Read Noise to Enable Photon Counting

被引：15

作者：

Guidash, Michael ^{[1
]}

Ma, Jiaju ^{[2
]}

Vogelsang, Thomas ^{[1
]}

Endsley, Jay ^{[1
]}

机构：

[1] Rambus Inc, Sunnyvale, CA 94089 USA

[2] Dartmouth Coll, Thayer Sch Engn, Hanover, NH 03755 USA

来源：

SENSORS | 2016年 / 16卷 / 04期

关键词：

CMOS; image sensor; photon counting; read noise;

D O I：

10.3390/s16040517

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Recent activity in photon counting CMOS image sensors (CIS) has been directed to reduction of read noise. Many approaches and methods have been reported. This work is focused on providing sub 1 e(-) read noise by design and operation of the binary and small signal readout of photon counting CIS. Compensation of transfer gate feed-through was used to provide substantially reduced CDS time and source follower (SF) bandwidth. SF read noise was reduced by a factor of 3 with this method. This method can be applied broadly to CIS devices to reduce the read noise for small signals to enable use as a photon counting sensor.

引用

页数：16

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