Error propagation in pesticide residue measurements estimated by computational simulations and inter-laboratory sample analysis

被引:3
作者
Nanita, Sergio C. [1 ]
Ziegler, Melissa [2 ]
Giammarrusti, Livio [3 ]
Huber, Andreas [4 ]
Astor, Elena [5 ]
Ruhl, Janet C. [1 ]
机构
[1] DuPont Crop Protect, Stine Haskell Res Ctr, Newark, DE USA
[2] DuPont Engn Res & Technol, Appl Stat, Expt Stn, Wilmington, DE USA
[3] DuPont Nemours Italiana SRL, Ctr Direzionale Villa Fiorita, Cernusco Sul Naviglio, MI, Italy
[4] DuPont Nemours Deutschland GmbH, Neu Isenburg, Germany
[5] DuPont Iberica SL, Barcelona, Spain
关键词
Residue analysis; trace-level analysis; pesticides; maximum residue limit (MRL); TANDEM MASS-SPECTROMETRY; LIQUID-CHROMATOGRAPHY; UNCERTAINTY; VARIABILITY;
D O I
10.1080/03601230903163566
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
An assessment of the error associated with conventional pesticide residue analysis has been conducted based on computer simulations and inter-laboratory residue analysis. Computational simulations were conducted based on (i) typical performance and regulatory acceptance criteria of analytical methods, and (ii) field residue distributions. In addition, field samples with incurred residues were sent to different private laboratories and the results compared. The relative difference in pesticide residues obtained when samples from the same field or produce lot are analyzed at separate laboratories was used to quantify the uncertainty associated with residue analyses performed using common analytical technology, and methods that are in compliance with current regulatory requirements. The study showed that differences of > 100% are common and should be expected when samples from the same crop are analyzed at different laboratories. The results also suggest that the error within residue measurements can be particularly detrimental when a result is reported near the maximum residue limit (MRL).
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页码:640 / 648
页数:9
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