High power GaN-FET amplifier with reduced memory effects for W-CDMA base stations

被引:0
|
作者
Wakejima, Akio [1 ]
Matsunaga, Kohji [1 ]
Ando, Yuji [1 ]
Nakayama, Tatsuo [1 ]
Okamoto, Yasuhiro [1 ]
Ota, Kazuki [1 ]
Kuroda, Naotaka [1 ]
Tanomura, Masahiro [1 ]
Miyamoto, Hironobu [1 ]
机构
[1] NEC Syst Device Res Labs, Adv HF Device R&D Ctr, R&D Assoc Future Electron Devices, Otsu, Shiga 5200833, Japan
来源
IEICE TRANSACTIONS ON ELECTRONICS | 2007年 / E90C卷 / 05期
关键词
GaN-FET; amplifier; memory effects; baseband impedance; digital predistortion; W-CDMA;
D O I
10.1093/ietele/e90-c.5.929
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes a high power GaN-FET amplifier which is developed for wideband code division multiple access (W-CDMA) base stations. We design a bias network which is symmetrically arranged to the RF line (two way bias network) in order to reduce impedance at a baseband frequency of the multi-carrier W-CDMA signal. As a result, the amplifier with the two way bias network successfully suppressed memory effects. Therefore, the application of a DPD technique to the GaN-FET amplifier with the two way bias network demonstrates almost 20dB linearity improvement in IM3 and considerable improvement in higher order IMD, resulting in low IMD of less than -50 dBc at the highest ever reported W-CDMA average output power of 76 W.
引用
收藏
页码:929 / 936
页数:8
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