Electron tomography simulator with realistic 3D phantom for evaluation of acquisition, alignment and reconstruction methods

被引:1
作者
Wan, Xiaohua [1 ,2 ]
Katchalski, Tsvi [2 ]
Churas, Christopher [2 ]
Ghosh, Sreya [2 ]
Phan, Sebastien [2 ]
Lawrence, Albert [2 ]
Hao, Yu [1 ]
Zhou, Ziying [1 ,5 ]
Chen, Ruijuan [2 ,6 ]
Chen, Yu [1 ]
Zhang, Fa [1 ]
Ellisman, Mark H. [2 ,3 ,4 ]
机构
[1] Chinese Acad Sci, Inst Comp Technol, Beijing, Peoples R China
[2] Univ Calif San Diego, Natl Ctr Microscopy & Imaging Res, San Diego, CA 92103 USA
[3] Univ Calif San Diego, Dept Neurosci, San Diego, CA 92103 USA
[4] Univ Calif San Diego, Dept Bioengn, San Diego, CA 92103 USA
[5] Beijing Inst Technol, Beijing, Peoples R China
[6] Tianjin Polytech Univ, Sch Elect & Informat Engn, Tianjin, Peoples R China
基金
美国国家科学基金会;
关键词
Electron; Microscope; Tomography; Simulator; Tilt; Series; Reconstruction; Tracking; Alignment; Block face; Inversion; Curvilinear; Warping; MICROSCOPY; TRANSFORM;
D O I
10.1016/j.jsb.2017.04.002
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
Because of the significance of electron microscope tomography in the investigation of biological structure at nanometer scales, ongoing improvement efforts have been continuous over recent years. This is particularly true in the case of software developments. Nevertheless, verification of improvements delivered by new algorithms and software remains difficult. Current analysis tools do not provide adaptable and consistent methods for quality assessment. This is particularly true with images of biological samples, due to image complexity, variability, low contrast and noise. We report an electron tomography (ET) simulator with accurate ray optics modeling of image formation that includes curvilinear trajectories through the sample, warping of the sample and noise. As a demonstration of the utility of our approach, we have concentrated on providing verification of the class of reconstruction methods applicable to wide field images of stained plastic-embedded samples. Accordingly, we have also constructed digital phantoms derived from serial block face scanning electron microscope images. These phantoms are also easily modified to include alignment features to test alignment algorithms. The combination of more realistic phantoms with more faithful simulations facilitates objective comparison of acquisition parameters, alignment and reconstruction algorithms and their range of applicability. With proper phantoms, this approach can also be modified to include more complex optical models, including distance-dependent blurring and phase contrast functions, such as may occur in cryotomography. (C) 2017 Elsevier Inc. All rights reserved.
引用
收藏
页码:103 / 115
页数:13
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