机构:
Univ Sao Paulo, Escola Politecn, Dept Engn Electron, Lab Microelectron, BR-05424970 Sao Paulo, BrazilUniv Sao Paulo, Escola Politecn, Dept Engn Electron, Lab Microelectron, BR-05424970 Sao Paulo, Brazil
Stem, N
[1
]
Cid, M
论文数: 0引用数: 0
h-index: 0
机构:
Univ Sao Paulo, Escola Politecn, Dept Engn Electron, Lab Microelectron, BR-05424970 Sao Paulo, BrazilUniv Sao Paulo, Escola Politecn, Dept Engn Electron, Lab Microelectron, BR-05424970 Sao Paulo, Brazil
Cid, M
[1
]
机构:
[1] Univ Sao Paulo, Escola Politecn, Dept Engn Electron, Lab Microelectron, BR-05424970 Sao Paulo, Brazil
来源:
1997 SBMO/IEEE MTTS-S - INTERNATIONAL MICROWAVE AND OPTOELECTRONICS CONFERENCE, PROCEEDINGS, VOLS 1 AND 2
|
1997年
关键词:
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Considering the recent modification of n-type highly doped silicon parameters [1], these work has been made based on one-dimensional models with analytical solutions [2,3]. In order to get a good accuracy, a fifth order approximation has been considered. Passivated emitters with gaussian profile of n(+)pp(+) solar cells were optimized. According to our results. emitter solar cells show their best efficiencies (eta similar or equal to 21.60 - 21.70 %) with N-s = 1 x 10(19) - 5 x 10(18) (cm(-3)) and (1.2 - 2.0)mu M emitter thickness range.