SI-Traceable Analysis of Nanomaterials by X-ray Spectrometry

被引:0
作者
Beckhoff, Burkhard [1 ]
机构
[1] PTB, German Natl Metrol Inst, Xray Spectrometry Grp, Berlin, Germany
关键词
SYNCHROTRON-RADIATION; FLUORESCENCE; SURFACES;
D O I
暂无
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
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页码:36 / 38
页数:3
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